[PATCH] add big major tests to udev-test.pl

[elogind.git] / extras / scsi_id / scsi_id.h

diff --git a/extras/scsi_id/scsi_id.h b/extras/scsi_id/scsi_id.h
index eb9498ab71f0fb35a9b5eaac491c605f1d9a38a0..9edb39ec49c6c8cefca95aaeba4ff767ca15ccfc 100644 (file)
--- a/extras/scsi_id/scsi_id.h
+++ b/extras/scsi_id/scsi_id.h
@@ -27,6 +27,12 @@
 #define        MAX_NAME_LEN    72
 #define OFFSET (2 * sizeof(unsigned int))
 
+/*
+ * MAX_ATTR_LEN: maximum length of the result of reading a sysfs
+ * attribute.
+ */
+#define        MAX_ATTR_LEN    256
+
 /*
  * MAX_SERIAL_LEN: the maximum length of the serial number, including
  * added prefixes such as vendor and product (model) strings.
@@ -39,16 +45,11 @@
  */
 #define MAX_BUFFER_LEN 256
 
-static inline char *sysfs_get_attr(struct sysfs_class_device *dev,
-                                   const char *attr)
-{
-       return sysfs_get_value_from_attributes(dev->directory->attributes,
-                                              attr);
-}
-
-extern int scsi_get_serial (struct sysfs_class_device *scsi_dev,
-                           const char *devname, int page_code, char *serial,
-                           int len);
+extern int sysfs_get_attr(const char *devpath, const char *attr, char *value,
+                         size_t bufsize);
+extern int scsi_get_serial (struct sysfs_device *scsi_dev, const char
+                           *devname, int page_code, char *serial, int
+                           len);
 extern void log_message (int level, const char *format, ...)
        __attribute__ ((format (printf, 2, 3)));